Storage Card Reader Test Number of Seeks

[rp]

Can someone explain how to use the "Number of Seeks" setting for the Card Reader test?  The default value I have is 1000 and I want to know if that is an optimal value. 

[fwilson]

RP,

That will work fine.  That is what I use.

-Fred

[rp]

Does the number of seeks relate to how many bits on the drive are tested?  My concern is to test every bit.

[fwilson]

rp,

Yes, the number of seeks relates to how much of the drive to test. The seek test is to test, well, seeks not the integrity of the media.  If you want to test the entire drive then use one of the Scan or Pattern test windows tests. (This is taken from the PCDR manual) 

Pattern Test
Test Key: PatternCardReaderTest
The Patterns Test is used to determine if the card reader is writing and reading data successfully. For each memory
location on the card, the test first saves the original contents of the location before testing it. The test then writes a data
pattern to the MMC memory locations (how many patterns and which patterns the test will use are configured in the
PCDrPCCardReader.p5i). When done writing the configured test pattern(s), the test then attempts to read the data
pattern(s) written to the memory location.
Test Instructions
This test requires you to insert supported media into the drive prior to running it.
To run the test:
1. Start the test
2. Wait for completion
3. If the test produces a Failed result, view the test log for detailed test information.
If the test reads a different data pattern then the one that was written, it will log as Failed. When the test completes
testing of a memory location, it restores the original contents and moves on to the next memory location.

Scan Test
Test Key: ScanCardReaderTest
The Scan Test attempts to access memory locations on the MMC in a linear fashion, moving from one memory location
to the next until the entire card is tested.
Test Instructions
In order for testing to take place, suitable test media must be in the tested drive. All tests begin by scanning the inserted
media to determine the number of sectors. Since it would take too long to read from every sector, a significant subset
of sectors spread over the entire media are tested. To improve test coverage, we recommend using test media with as
much data on it as possible.
To run the test:
1. Start the test
2. Wait for completion
3. If the test produces a Failed result, view the test log for detailed test information.
If the test is unable to access any of the tested memory locations, it logs as Failed.